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1. #Bruker apex ii ccd detector pro
2. #Bruker apex ii ccd detector software
3. #Bruker apex ii ccd detector plus

#Bruker apex ii ccd detector software

The latest versions of the Bruker Apex2 software are employed to collect, solve, and refine the data.Īccess to the Cambridge Structural Database (CSD) is also available. The high intensity of the X-ray source combined with the sensitivity of the Apex II detector allows high-resolution data to be collected on crystals with dimensions as small as 10µm. To analyze single crystal samples, the BYU XRD lab is equipped with a MACH3 four circle diffractometer coupled to a Bruker-Nonius FR591 Cu rotating anode X-ray source, a Bruker Apex II CCD detector, and a low temperature (100-300 K) Kryoflex device. The P-XRD accommodates several sample volumes and forms: In essence, if it is solid, crystalline, and can be made to have or form a relatively flat surface, the P-XRD can be used to investigate its atomic structure.Ī variety of sample holders are available at the facility. Polycrystalline samples can range from powders and nanoparticles to thin films and machined parts. Materials or particles consisting of more than one crystal or distinct crystal lattice are ‘polycrystalline’ materials. Stacey Smith for more information, trainings, assistance in running an experiment, or help submitting a sample for analysis.

Sample holders are available at the XRD Facility. Be sure your sample fits one of the sample sizes listed below.Place your sample and the printed, completed form in the sample submission box in the center of the south wall of C330 BNSN.To submit a sample to the XRD facility for employees to analyze:.Once trained, schedule time with the P-XRD here.To run experiments autonomously, users must complete the requisite trainings (see the Training Information tab).Use of the P-XRD is free of charge for individuals and groups affiliated with BYU.The P-XRD is routinely used to identify crystalline materials, calculate the crystallite size of nanomaterials, quantify mixtures of crystalline solids, refine crystal structures via Rietveld refinement, perform in-situ high temperature experiments, and perform capillary experiments for air-sensitive samples. Access to the International Center for Diffraction Data (ICDD) database is also available. 3.0) are employed to collect, view, and analyze P-XRD data.

#Bruker apex ii ccd detector plus

The PANalytical software programs X’Pert Data Collector (v ), X’Pert Data Viewer, and X’Pert HighScore Plus (v. For air-sensitive samples, the instrument is equipped with a capillary sample mount and a focusing mirror. A bracket sample stage is available for mounting wafers, films, and other flat solid samples (< 3.0 mm thick).įor in-situ high temperature experiments with powder samples, the instrument is equipped with an Anton Paar HTK 1200 high temperature stage (300-1200☌). The standard configuration of the instrument includes a 15-position automatic sample changer coupled to a reflection/ transmission sample stage with sample spinning capabilities. Programmable divergence and anti-scatter slits enable the use of both fixed slit (for amply thick sample volumes) and automated slit (for very thin sample volumes) configurations. A Ge monochromator also routinely provides a monochromatic source of the Cu K α1 wavelength (1.5406 Å).

#Bruker apex ii ccd detector pro

The PANalytical X'Pert Pro MPD diffractometer (P-XRD) analyzes polycrystalline samples with a sealed tube Cu X-Ray source and an X'Celerator detector. PANalytical X'Pert Pro MPD Diffractometer